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                 >  产品中心  >  半导体封测设备

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                半导体激光器全自动COS综合性能测试设备
                LD-COS检测设备:用于激光芯片贴片后,光性能的检测设备。传统检测方式为人工上下料,仪器检测数据,人工筛选和记录。本设¤备将全面实现自动化,大大提高芯片检出效率,减少人为操作带来的误判或■芯片损伤,更省人省时。
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                激光器半导体芯片检测设备
                激光器半导体芯片检测设备 应用领域:芯片摘取、芯片识别、分拣、高精度缺陷检测;
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                激光器芯片扩膜摘料设备
                激光器芯片扩膜摘料设备:激光器芯片经过划片、裂片后,进行蓝膜扩膜分隔产品间距,通过OCR字符∑ 识别与Map表格对应,实现力控吸取物料Wafer To Tray,并且检测N面,P面,共晶面,Wire Boned面缺陷,良率达到99.95%以上。节省人力6人,经济效益50W/年、
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